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fixed some broken tests

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This commit is contained in:
hneemann 2017-03-10 18:56:41 +01:00
parent 99650afb82
commit 077541c06c
2 changed files with 4 additions and 4 deletions
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2
src/test/java/de/neemann/digital/builder/ATF1502/ATF1502CuplExporterTest.java
View File

@ -42,7 +42,7 @@ public class ATF1502CuplExporterTest extends TestCase {
"Company unknown ;\r\n" +
"Assembly None ;\r\n" +
"Location unknown ;\r\n" +
"Device f1502plcc44 ;\r\n" +
"Device f1502ispplcc44 ;\r\n" +
"\r\n" +
"ar = 'b'0 ;\r\n" +
"\r\n" +

6
src/test/java/de/neemann/digital/builder/tt2/TT2ExporterTest.java
View File

@ -27,7 +27,7 @@ public class TT2ExporterTest extends TestCase {
"#$ TITLE unknown\r\n" +
"#$ MODULE unknown\r\n" +
"#$ JEDECFILE unknown\r\n" +
"#$ DEVICE f1502plcc44\r\n" +
"#$ DEVICE f1502ispplcc44\r\n" +
"#$ PINS 6 A+:4 A1+:5 B+:6 B1+:8 Y+:20 X+:21\r\n" +
".i 4\r\n" +
".o 2\r\n" +
@ -54,7 +54,7 @@ public class TT2ExporterTest extends TestCase {
"#$ TITLE unknown\r\n" +
"#$ MODULE unknown\r\n" +
"#$ JEDECFILE unknown\r\n" +
"#$ DEVICE f1502plcc44\r\n" +
"#$ DEVICE f1502ispplcc44\r\n" +
"#$ PINS 3 A+:4 CLK+:43 Yn+:5\r\n" +
".i 3\r\n" +
".o 3\r\n" +
@ -82,7 +82,7 @@ public class TT2ExporterTest extends TestCase {
"#$ TITLE unknown\r\n" +
"#$ MODULE unknown\r\n" +
"#$ JEDECFILE unknown\r\n" +
"#$ DEVICE f1502plcc44\r\n" +
"#$ DEVICE f1502ispplcc44\r\n" +
"#$ PINS 5 A+:4 B+:5 CLK+:43 Yn+:6 Xn+:8\r\n" +
".i 5\r\n" +
".o 6\r\n" +