minor changes to test circuits

This commit is contained in:
hneemann 2017-06-24 11:53:47 +02:00
parent 8ce338e39c
commit c3a438c68f
5 changed files with 41 additions and 14 deletions

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@ -1,7 +1,12 @@
<?xml version="1.0" encoding="utf-8"?> <?xml version="1.0" encoding="utf-8"?>
<circuit> <circuit>
<version>1</version> <version>1</version>
<attributes/> <attributes>
<entry>
<string>Description</string>
<string>Gate Diffusion Input (GDI) xor</string>
</entry>
</attributes>
<visualElements> <visualElements>
<visualElement> <visualElement>
<elementName>In</elementName> <elementName>In</elementName>
@ -45,12 +50,22 @@
</visualElement> </visualElement>
<visualElement> <visualElement>
<elementName>PFET</elementName> <elementName>PFET</elementName>
<elementAttributes/> <elementAttributes>
<entry>
<string>unidirectional</string>
<boolean>true</boolean>
</entry>
</elementAttributes>
<pos x="460" y="160"/> <pos x="460" y="160"/>
</visualElement> </visualElement>
<visualElement> <visualElement>
<elementName>NFET</elementName> <elementName>NFET</elementName>
<elementAttributes/> <elementAttributes>
<entry>
<string>unidirectional</string>
<boolean>true</boolean>
</entry>
</elementAttributes>
<pos x="460" y="240"/> <pos x="460" y="240"/>
</visualElement> </visualElement>
<visualElement> <visualElement>

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@ -4,10 +4,7 @@
<attributes> <attributes>
<entry> <entry>
<string>Description</string> <string>Description</string>
<string>10 Transistor Full Adder <string>10 Transistor Full Adder</string>
The drivers represent p-channel fets. Needed to
avoid the resistance problem
(see https://github.com/hneemann/Digital/issues/30).</string>
</entry> </entry>
</attributes> </attributes>
<visualElements> <visualElements>

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@ -55,17 +55,32 @@
</visualElement> </visualElement>
<visualElement> <visualElement>
<elementName>NFET</elementName> <elementName>NFET</elementName>
<elementAttributes/> <elementAttributes>
<entry>
<string>unidirectional</string>
<boolean>true</boolean>
</entry>
</elementAttributes>
<pos x="900" y="340"/> <pos x="900" y="340"/>
</visualElement> </visualElement>
<visualElement> <visualElement>
<elementName>PFET</elementName> <elementName>PFET</elementName>
<elementAttributes/> <elementAttributes>
<entry>
<string>unidirectional</string>
<boolean>true</boolean>
</entry>
</elementAttributes>
<pos x="1100" y="300"/> <pos x="1100" y="300"/>
</visualElement> </visualElement>
<visualElement> <visualElement>
<elementName>NFET</elementName> <elementName>NFET</elementName>
<elementAttributes/> <elementAttributes>
<entry>
<string>unidirectional</string>
<boolean>true</boolean>
</entry>
</elementAttributes>
<pos x="1100" y="380"/> <pos x="1100" y="380"/>
</visualElement> </visualElement>
<visualElement> <visualElement>

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@ -4,7 +4,7 @@
<attributes> <attributes>
<entry> <entry>
<string>Description</string> <string>Description</string>
<string>CMOS mirror adder</string> <string>28T CMOS mirror adder</string>
</entry> </entry>
</attributes> </attributes>
<visualElements> <visualElements>

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@ -5,9 +5,9 @@
<entry> <entry>
<string>Description</string> <string>Description</string>
<string>Static Energy Recovery Full Adder (SERF) <string>Static Energy Recovery Full Adder (SERF)
The drivers represent n-channel fets. Needed to R. Shalem, E. John, and L. K. John,
avoid the resistance problem “A novel low-power energy recovery full adder cell”,
(see https://github.com/hneemann/Digital/issues/30).</string> in Proc. Great Lakes Symp. VLSI , Feb. 1999, pp. 380 383.</string>
</entry> </entry>
</attributes> </attributes>
<visualElements> <visualElements>