From d3110c699b6dfa2aebae8a1a868fb49be3b41b89 Mon Sep 17 00:00:00 2001
From: hneemann <helmut.neemann@arcor.de>
Date: Wed, 19 Apr 2017 14:33:21 +0200
Subject: [PATCH] updated release notes

---
 distribution/ReleaseNotes.txt | 2 ++
 1 file changed, 2 insertions(+)

diff --git a/distribution/ReleaseNotes.txt b/distribution/ReleaseNotes.txt
index 05c116811..db790713a 100644
--- a/distribution/ReleaseNotes.txt
+++ b/distribution/ReleaseNotes.txt
@@ -4,6 +4,8 @@ planned as v0.11
 - Added floating gate FETs.
 - Better detecting of missing signals in test cases.
 - Better plausibility checks if diodes are used.
+- Added a loop command to the test data parser.
+  See "cmos/sram.dig" as an example usage of the new loop statement.
 
 v0.10, released on 09. Apr 2017
 - User can select the expressions representation format in the settings dialog.