From f3d78c628018970a97e97c8304ccff74187a7127 Mon Sep 17 00:00:00 2001 From: hneemann Date: Mon, 17 Apr 2017 09:23:46 +0200 Subject: [PATCH] Better error messages if test cases with missing signals are used. --- distribution/ReleaseNotes.txt | 4 +++- src/main/java/de/neemann/digital/testing/TestResult.java | 8 ++++---- 2 files changed, 7 insertions(+), 5 deletions(-) diff --git a/distribution/ReleaseNotes.txt b/distribution/ReleaseNotes.txt index c6fe654b7..05c116811 100644 --- a/distribution/ReleaseNotes.txt +++ b/distribution/ReleaseNotes.txt @@ -1,7 +1,9 @@ Release Notes planned as v0.11 -- Added floating gate FETs +- Added floating gate FETs. +- Better detecting of missing signals in test cases. +- Better plausibility checks if diodes are used. v0.10, released on 09. Apr 2017 - User can select the expressions representation format in the settings dialog. diff --git a/src/main/java/de/neemann/digital/testing/TestResult.java b/src/main/java/de/neemann/digital/testing/TestResult.java index ac0602c45..13f25319d 100644 --- a/src/main/java/de/neemann/digital/testing/TestResult.java +++ b/src/main/java/de/neemann/digital/testing/TestResult.java @@ -75,16 +75,16 @@ public class TestResult { } } + for (String name : names) + if (!usedSignals.contains(name)) + throw new TestingDataException(Lang.get("err_testSignal_N_notFound", name)); + if (inputs.size() == 0) throw new TestingDataException(Lang.get("err_noTestInputSignalsDefined")); if (outputs.size() == 0) throw new TestingDataException(Lang.get("err_noTestOutputSignalsDefined")); - for (String name : names) - if (!usedSignals.contains(name)) - throw new TestingDataException(Lang.get("err_testSignal_N_notFound", name)); - model.init(); for (Value[] rowWithDontCare : lines) {