81 Commits

Author SHA1 Message Date
hneemann
bfdf5aeb16 Added some more 74xx examples. 2017-05-12 19:17:17 +02:00
hneemann
1dcc1dbb4c Added a DIL shape which can be used to represent an embedded circuit.
Also added some 74xx examples.
2017-05-12 16:42:03 +02:00
hneemann
0368177fc2 create an error if add or sub with more then 63 bits are used 2017-04-22 09:41:05 +02:00
hneemann
532e17eae5 added an error message if diodes are not used correctly 2017-04-17 09:08:20 +02:00
hneemann
4e7226cfbe added some more test cases 2017-04-16 12:08:47 +02:00
hneemann
473cf93297 Added a floating gate P channel fet 2017-04-15 18:50:04 +02:00
hneemann
e82e59a67d Added a floating gate N channel fet 2017-04-15 15:42:51 +02:00
hneemann
8ef847e056 modified some example circuits 2017-04-14 14:15:51 +02:00
hneemann
6a134fb837 added a LedMatrix circuit to the processor. 2017-04-08 21:28:18 +02:00
hneemann
def1cc854e added some transparency tests 2017-04-08 10:56:12 +02:00
hneemann
0e918722ff added tests to test if if works if nets in nested circuits are merged via a direct nested connection 2017-04-07 13:23:46 +02:00
hneemann
05ba2abf42 added a counter example 2017-04-03 20:37:28 +02:00
helmut.neemann
e8fa58e0df modified cmos flip flops 2017-03-24 11:21:18 +01:00
hneemann
f5cddf1aba added some examples 2017-03-22 20:20:19 +01:00
hneemann
1c1a6c3fe9 Added two cycle CPU with RAM and ROM sharing the same address space. 2017-03-18 19:59:52 +01:00
hneemann
4263ece634 added a RAM with a select/enable input 2017-03-11 12:21:42 +01:00
hneemann
5932987a20 Fixed some bug concerning switches
added a 16-Bit SRAM example
2017-03-05 21:36:04 +01:00
hneemann
b28e97b305 Fixed some bug concerning switches
added a 16-Bit SRAM example
2017-03-05 21:34:03 +01:00
hneemann
c157bee3a7 added switch multi-bit tests 2017-03-04 22:32:15 +01:00
hneemann
5a7088766f Relay has two inputs and works more like a real relay. 2017-03-03 19:43:45 +01:00
hneemann
92b970bd47 added some test cases 2017-02-28 09:08:06 +01:00
hneemann
cd78f63730 Connect the bulk of the n-fets to ground, and of the p-fets to Vdd. 2017-02-25 15:40:23 +01:00
hneemann
e1c65d1f98 More concise handling of errors occurring during test execution. 2017-02-25 14:56:55 +01:00
hneemann
2262d7e3d2 added an cmos xor gate test case 2017-02-24 15:29:23 +01:00
hneemann
bad4a92d10 added an cmos or gate 2017-02-24 13:38:48 +01:00
hneemann
8741bd9ea1 moved some examples to distribution 2017-02-23 15:25:14 +01:00
hneemann
982d077c11 fets behave more like fets and not like relays.
If a n-chan fat has a high gate and a high source, this fet is not conducting.
Also if the gate is high and source is floating the fet is not conducting.
2017-02-23 09:53:00 +01:00
hneemann
40cf61b37e added an open drain test case 2017-02-22 20:31:28 +01:00
hneemann
07e551a99d added a tristate test case 2017-02-22 20:08:51 +01:00
hneemann
1c17776ffb added FETs 2017-02-22 18:17:26 +01:00
hneemann
f7f99d9277 fixed a bug caused by invalidated unused switch handlers 2017-02-22 16:55:34 +01:00
hneemann
870daebff2 added some more tests 2017-02-22 14:54:32 +01:00
hneemann
135e996e0d Added some more switch test cases 2017-02-22 14:28:47 +01:00
hneemann
0a6d164ed1 Added some switch test cases 2017-02-22 14:06:56 +01:00
hneemann
100c7330c6 Added some test cases 2017-02-22 13:40:33 +01:00
hneemann
9f079883a6 improved tests in PAL and PLA 2017-01-02 16:21:29 +01:00
hneemann
47ef6e876d some minor changes to the interruptible processor. 2016-12-23 22:18:06 +01:00
helmut.neemann
0c7be6ddc7 used separate ControlUnit for Processor with Interrupt-Controller 2016-12-22 08:44:55 +01:00
hneemann
f05f8b492e fixed distribution examples test 2016-12-21 22:10:38 +01:00
hneemann
0c7aea59e0 added an additional test 2016-12-14 20:34:21 +01:00
hneemann
887e5c2bbe added simple interrupt controller to processor 2016-12-14 10:39:12 +01:00
hneemann
1c21d0328f added GPI Element to the processor 2016-12-13 13:52:52 +01:00
hneemann
c73f4c119f made expression parser more flexible udn added integer literal HEX notation to parser 2016-12-03 11:39:01 +01:00
hneemann
85f12648f7 added some more tests 2016-12-01 21:22:06 +01:00
hneemann
3dc095d89d made "don't care" in test case inputs functional 2016-12-01 20:44:51 +01:00
hneemann
78b63247b8 added tests for comparators 2016-11-30 21:19:53 +01:00
hneemann
99ee98a445 added tests for some arithmetic examples 2016-11-30 21:09:07 +01:00
hneemann
b63959a3e6 added tests for the adders 2016-11-30 20:52:34 +01:00
Helmut.Neemann
5b82a9766e fixed a bug which occurred if an embedded circuit connects directly two nets which are already the same net. 2016-11-30 10:56:57 +01:00
Helmut.Neemann
acfaaec290 added an additional testcase 2016-11-30 10:39:43 +01:00