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allows to use probe values as test case outputs; closes #562

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hneemann 2020-11-19 20:48:19 +01:00
parent 57deba5465
commit 3bee073886
2 changed files with 2 additions and 1 deletions
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1
distribution/ReleaseNotes.txt
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@ -8,6 +8,7 @@ HEAD, planned as v0.26
- Added a "Not Connected" component to output a constant high-z value. - Added a "Not Connected" component to output a constant high-z value.
- If a high-z value is connected to a logic gate input, the read value - If a high-z value is connected to a logic gate input, the read value
is undefined. is undefined.
- It is now possible to use a probe as output in a test case.
- Fixed a bug in the Demuxer Verilog template that causes problems - Fixed a bug in the Demuxer Verilog template that causes problems
when using multiple demuxers in the same circuit. when using multiple demuxers in the same circuit.
- Generic circuits are easier to debug: It is possible now to create - Generic circuits are easier to debug: It is possible now to create

2
src/main/java/de/neemann/digital/core/io/Probe.java
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@ -56,7 +56,7 @@ public class Probe implements Element {
@Override @Override
public void registerNodes(Model model) { public void registerNodes(Model model) {
model.addSignal(new Signal(label, value).setShowInGraph(showInGraph).setFormat(format)); model.addOutput(new Signal(label, value).setShowInGraph(showInGraph).setFormat(format));
model.registerGlobalValue(label, value); model.registerGlobalValue(label, value);
} }