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updated release notes

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hneemann 2017-04-19 14:33:21 +02:00
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distribution/ReleaseNotes.txt
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@ -4,6 +4,8 @@ planned as v0.11
- Added floating gate FETs.
- Better detecting of missing signals in test cases.
- Better plausibility checks if diodes are used.
- Added a loop command to the test data parser.
See "cmos/sram.dig" as an example usage of the new loop statement.
v0.10, released on 09. Apr 2017
- User can select the expressions representation format in the settings dialog.