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Better error messages if test cases with missing signals are used.

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hneemann 2017-04-17 09:23:46 +02:00
parent 532e17eae5
commit f3d78c6280
2 changed files with 7 additions and 5 deletions
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4
distribution/ReleaseNotes.txt
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@ -1,7 +1,9 @@
Release Notes Release Notes
planned as v0.11 planned as v0.11
- Added floating gate FETs - Added floating gate FETs.
- Better detecting of missing signals in test cases.
- Better plausibility checks if diodes are used.
v0.10, released on 09. Apr 2017 v0.10, released on 09. Apr 2017
- User can select the expressions representation format in the settings dialog. - User can select the expressions representation format in the settings dialog.

8
src/main/java/de/neemann/digital/testing/TestResult.java
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@ -75,16 +75,16 @@ public class TestResult {
} }
} }
for (String name : names)
if (!usedSignals.contains(name))
throw new TestingDataException(Lang.get("err_testSignal_N_notFound", name));
if (inputs.size() == 0) if (inputs.size() == 0)
throw new TestingDataException(Lang.get("err_noTestInputSignalsDefined")); throw new TestingDataException(Lang.get("err_noTestInputSignalsDefined"));
if (outputs.size() == 0) if (outputs.size() == 0)
throw new TestingDataException(Lang.get("err_noTestOutputSignalsDefined")); throw new TestingDataException(Lang.get("err_noTestOutputSignalsDefined"));
for (String name : names)
if (!usedSignals.contains(name))
throw new TestingDataException(Lang.get("err_testSignal_N_notFound", name));
model.init(); model.init();
for (Value[] rowWithDontCare : lines) { for (Value[] rowWithDontCare : lines) {