hneemann
|
30044bf8c6
|
typos
|
2017-04-22 10:28:03 +02:00 |
|
hneemann
|
0368177fc2
|
create an error if add or sub with more then 63 bits are used
|
2017-04-22 09:41:05 +02:00 |
|
hneemann
|
007015f461
|
typo
|
2017-04-21 22:05:18 +02:00 |
|
hneemann
|
1942749fa9
|
added possibility to open a circuit from the command line
|
2017-04-21 22:00:12 +02:00 |
|
hneemann
|
42ff6cc424
|
added possibility to open a circuit from the command line
|
2017-04-21 21:51:58 +02:00 |
|
hneemann
|
8da3315f6b
|
screenshot updated
|
2017-04-21 13:24:55 +02:00 |
|
hneemann
|
07547b1af0
|
made test faster
|
2017-04-20 20:42:11 +02:00 |
|
hneemann
|
c85e3e1011
|
updated release notes
v0.11
|
2017-04-20 20:11:09 +02:00 |
|
hneemann
|
0e37cb9cdc
|
typo
|
2017-04-19 19:54:23 +02:00 |
|
hneemann
|
4d92a55cbb
|
refactoring of input don't care handling
|
2017-04-19 19:51:27 +02:00 |
|
hneemann
|
311793d7dd
|
If there are to many test results, lines are discarded from the result view. They are still executed.
|
2017-04-19 17:45:22 +02:00 |
|
hneemann
|
871187305c
|
typo
|
2017-04-19 17:09:57 +02:00 |
|
hneemann
|
31d8ee0912
|
simplified test data parser
|
2017-04-19 16:44:35 +02:00 |
|
hneemann
|
ba776b8ba4
|
simplified test data parser
|
2017-04-19 16:41:41 +02:00 |
|
hneemann
|
a6759f0073
|
white space
|
2017-04-19 16:16:45 +02:00 |
|
hneemann
|
83fdfa98c5
|
simplified SRAM example
|
2017-04-19 16:15:01 +02:00 |
|
hneemann
|
3d6000abe6
|
better test data parser to allow multi row repeats
|
2017-04-19 15:55:17 +02:00 |
|
hneemann
|
d3110c699b
|
updated release notes
|
2017-04-19 14:33:21 +02:00 |
|
hneemann
|
4b3e100730
|
better test data parser to allow multi row repeats
|
2017-04-19 14:28:01 +02:00 |
|
hneemann
|
c7393a2619
|
added two not working diode examples
|
2017-04-19 10:35:34 +02:00 |
|
hneemann
|
c50ca1b2ad
|
typo
|
2017-04-18 19:40:18 +02:00 |
|
hneemann
|
9c411b23c8
|
clarified the diodes help text
|
2017-04-18 14:46:14 +02:00 |
|
hneemann
|
f3d78c6280
|
Better error messages if test cases with missing signals are used.
|
2017-04-17 09:23:46 +02:00 |
|
hneemann
|
532e17eae5
|
added an error message if diodes are not used correctly
|
2017-04-17 09:08:20 +02:00 |
|
hneemann
|
0df2fbcd35
|
minor changes on FET shapes
|
2017-04-16 21:08:27 +02:00 |
|
hneemann
|
33bf560a53
|
correct fet pin names
|
2017-04-16 20:51:21 +02:00 |
|
hneemann
|
10b1fa73d4
|
typo
|
2017-04-16 20:06:49 +02:00 |
|
hneemann
|
4e7226cfbe
|
added some more test cases
|
2017-04-16 12:08:47 +02:00 |
|
hneemann
|
d3aa2afa4f
|
updated release notes
|
2017-04-15 21:31:31 +02:00 |
|
hneemann
|
473cf93297
|
Added a floating gate P channel fet
|
2017-04-15 18:50:04 +02:00 |
|
hneemann
|
1580e4dbd0
|
typo
|
2017-04-15 16:41:23 +02:00 |
|
hneemann
|
e82e59a67d
|
Added a floating gate N channel fet
|
2017-04-15 15:42:51 +02:00 |
|
hneemann
|
46e8891d26
|
Optimized switch creation by detecting more simple switches.
|
2017-04-15 13:33:13 +02:00 |
|
hneemann
|
8ef847e056
|
modified some example circuits
|
2017-04-14 14:15:51 +02:00 |
|
hneemann
|
f88a70bc47
|
added an error message if there are to many test case lines
|
2017-04-14 14:14:59 +02:00 |
|
hneemann
|
c42eb7b593
|
show frequency in kHz
|
2017-04-14 08:25:51 +02:00 |
|
hneemann
|
901c415726
|
show frequency in kHz
|
2017-04-11 20:18:19 +02:00 |
|
hneemann
|
c95c79fdc7
|
updated release notes
v0.10
|
2017-04-09 17:39:35 +02:00 |
|
hneemann
|
954deda10e
|
added some comments to Von Neumann processor
|
2017-04-09 13:42:52 +02:00 |
|
hneemann
|
ebfc1c9c7e
|
Modified scroll text message
|
2017-04-09 09:57:20 +02:00 |
|
hneemann
|
4da46de8d5
|
added a LedMatrix circuit to the processor.
|
2017-04-08 21:50:36 +02:00 |
|
hneemann
|
6a134fb837
|
added a LedMatrix circuit to the processor.
|
2017-04-08 21:28:18 +02:00 |
|
hneemann
|
c2acd018f9
|
reordering of components
|
2017-04-08 15:02:58 +02:00 |
|
hneemann
|
8e4621c2e0
|
added a LED matrix display
|
2017-04-08 14:34:57 +02:00 |
|
hneemann
|
c1e3cead2d
|
typo
|
2017-04-08 12:22:16 +02:00 |
|
hneemann
|
def1cc854e
|
added some transparency tests
|
2017-04-08 10:56:12 +02:00 |
|
hneemann
|
63de7a112f
|
typo
|
2017-04-07 14:00:32 +02:00 |
|
hneemann
|
0e918722ff
|
added tests to test if if works if nets in nested circuits are merged via a direct nested connection
|
2017-04-07 13:23:46 +02:00 |
|
hneemann
|
f15f2bc788
|
fixed an error if nets in nested circuits are merged via a direct nested connection
|
2017-04-07 13:01:29 +02:00 |
|
hneemann
|
ad6e26fa80
|
experimental creation of bidirectional counters in the table dialog
|
2017-04-07 10:35:09 +02:00 |
|