1415 Commits

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Author	SHA1	Message	Date
hneemann	dbb4ad6932	more concise handling of model created windows like LedDisplay or GraphicCard.	2017-04-23 21:21:38 +02:00
hneemann	f54c112683	updated the readme	2017-04-23 09:02:37 +02:00
hneemann	fda7749975	updated the readme	2017-04-23 09:01:17 +02:00
hneemann	cf057a2db2	updated the readme	2017-04-23 08:58:15 +02:00
hneemann	8239a8211f	removed some dead code	2017-04-22 18:39:40 +02:00
hneemann	6c36cdde6f	fixed a problem with unexpected change of default circuit	2017-04-22 18:10:53 +02:00
hneemann	f7e3df32f2	improved error messages	2017-04-22 15:51:45 +02:00
hneemann	af68b01106	improved error messages	2017-04-22 15:01:25 +02:00
hneemann	e60c63a332	typo	2017-04-22 13:15:36 +02:00
hneemann	c6ff0a3a70	more concise file name handling	2017-04-22 12:15:52 +02:00
hneemann	12593b5874	do not show a pin map dialog if no jedec file is created	2017-04-22 12:15:08 +02:00
hneemann	f4ba437c11	more concise file name handling	2017-04-22 11:58:16 +02:00
hneemann	f4128e848a	more concise file name handling	2017-04-22 11:55:21 +02:00
hneemann	30044bf8c6	typos	2017-04-22 10:28:03 +02:00
hneemann	0368177fc2	create an error if add or sub with more then 63 bits are used	2017-04-22 09:41:05 +02:00
hneemann	007015f461	typo	2017-04-21 22:05:18 +02:00
hneemann	1942749fa9	added possibility to open a circuit from the command line	2017-04-21 22:00:12 +02:00
hneemann	42ff6cc424	added possibility to open a circuit from the command line	2017-04-21 21:51:58 +02:00
hneemann	8da3315f6b	screenshot updated	2017-04-21 13:24:55 +02:00
hneemann	07547b1af0	made test faster	2017-04-20 20:42:11 +02:00
hneemann	c85e3e1011	updated release notes v0.11	2017-04-20 20:11:09 +02:00
hneemann	0e37cb9cdc	typo	2017-04-19 19:54:23 +02:00
hneemann	4d92a55cbb	refactoring of input don't care handling	2017-04-19 19:51:27 +02:00
hneemann	311793d7dd	If there are to many test results, lines are discarded from the result view. They are still executed.	2017-04-19 17:45:22 +02:00
hneemann	871187305c	typo	2017-04-19 17:09:57 +02:00
hneemann	31d8ee0912	simplified test data parser	2017-04-19 16:44:35 +02:00
hneemann	ba776b8ba4	simplified test data parser	2017-04-19 16:41:41 +02:00
hneemann	a6759f0073	white space	2017-04-19 16:16:45 +02:00
hneemann	83fdfa98c5	simplified SRAM example	2017-04-19 16:15:01 +02:00
hneemann	3d6000abe6	better test data parser to allow multi row repeats	2017-04-19 15:55:17 +02:00
hneemann	d3110c699b	updated release notes	2017-04-19 14:33:21 +02:00
hneemann	4b3e100730	better test data parser to allow multi row repeats	2017-04-19 14:28:01 +02:00
hneemann	c7393a2619	added two not working diode examples	2017-04-19 10:35:34 +02:00
hneemann	c50ca1b2ad	typo	2017-04-18 19:40:18 +02:00
hneemann	9c411b23c8	clarified the diodes help text	2017-04-18 14:46:14 +02:00
hneemann	f3d78c6280	Better error messages if test cases with missing signals are used.	2017-04-17 09:23:46 +02:00
hneemann	532e17eae5	added an error message if diodes are not used correctly	2017-04-17 09:08:20 +02:00
hneemann	0df2fbcd35	minor changes on FET shapes	2017-04-16 21:08:27 +02:00
hneemann	33bf560a53	correct fet pin names	2017-04-16 20:51:21 +02:00
hneemann	10b1fa73d4	typo	2017-04-16 20:06:49 +02:00
hneemann	4e7226cfbe	added some more test cases	2017-04-16 12:08:47 +02:00
hneemann	d3aa2afa4f	updated release notes	2017-04-15 21:31:31 +02:00
hneemann	473cf93297	Added a floating gate P channel fet	2017-04-15 18:50:04 +02:00
hneemann	1580e4dbd0	typo	2017-04-15 16:41:23 +02:00
hneemann	e82e59a67d	Added a floating gate N channel fet	2017-04-15 15:42:51 +02:00
hneemann	46e8891d26	Optimized switch creation by detecting more simple switches.	2017-04-15 13:33:13 +02:00
hneemann	8ef847e056	modified some example circuits	2017-04-14 14:15:51 +02:00
hneemann	f88a70bc47	added an error message if there are to many test case lines	2017-04-14 14:14:59 +02:00
hneemann	c42eb7b593	show frequency in kHz	2017-04-14 08:25:51 +02:00
hneemann	901c415726	show frequency in kHz	2017-04-11 20:18:19 +02:00